Non contact XYZ depth measuring microscope
FEATURES
• Ideal microscope for measuring precision components in 2 and 3 dimensions
• Specifically designed for accurate and repeatable measurements of thickness and depth
• Measures surface profile, flatness, roughness and alignment in X,Y and Z-Axis
• Z-Axis measurement with the Precise Focusing Image Module
• Three objective lenses available 5x, 20x, 50x
• Communication protocol with Nikon Data-Process system
• Obtains high accurate depth measurements simply by coinciding the upper and lower portions of a graticule
Applications
Various measurements such as :
- Height of lead frame
- Wafer bump height
- Height of solder
- Strain of lead frame
- Height of bonded portion of lead wire
- Steps on hybrid IC
- Terminal steps on multi-layer pc boards
- Recesses on cans
- Depth of metallic moulds
Standard Delivery
• Main body focus unit with reflector• Stand with transformer
• Nosepiece quintuple
• Optical body binocular
• Measuring stage 150mmx100mm with linear scale and stage glass
• 2-axis counter (Nikon)
• Z-axis indicator 25mm travel
• Eyepiece WF10x (Field 18)
• Eyepiece WF10X reticle
• Objective M Plan 10x, NA 0.25, WD 10.60
Optional Accessories
• Objective MPlan 5X,NA 0.10, WD 19.6mm
• Objective MPlan 20X,
NA 0.40, WD 12mm
• Objective MPlan 50X,
NA 0.50, WD 10.6mm
• Transmitted illuminator (lamp house)
• Stage 250mm x 100mm
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